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Information Modeling for Interoperable Dimensional Metrology by Zhao, Yaoyao (Fiona). Publication: . XIX, 367p. 146 illus. Availability: Copies available: AUM Main Library (1),
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Nanoindentation by Fischer-Cripps, Anthony C. Publication: . XXII, 282 p. Availability: Copies available: AUM Main Library (1),
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On-Chip Instrumentation by Stollon, Neal. Publication: . X, 244p. 100 illus. Availability: Copies available: AUM Main Library (1),
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Distributed Large-Scale Dimensional Metrology by Franceschini, Fiorenzo. Publication: . XVI, 233 p. 118 illus. Availability: Copies available: AUM Main Library (1),
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Three Great Tsunamis: Lisbon (1755), Sumatra-Andaman (2004) and Japan (2011) by Gupta, Harsh K. Publication: . IX, 89 p. 69 illus., 59 illus. in color. Availability: Copies available: AUM Main Library (1),
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Bouguer Gravity Regional and Residual Separation: Application to Geology and Environment by Mallick, K. Publication: . X, 250p. 70 illus., 10 illus. in color. Availability: Copies available: AUM Main Library (1),
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Natural Gas Hydrates by Ye, Yuguang. Publication: . XII, 402 p. 304 illus., 24 illus. in color. Availability: Copies available: AUM Main Library (1),
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Autonomous Sensor Networks by Filippini, Daniel. Publication: . X, 428 p. 168 illus., 105 illus. in color. Availability: Copies available: AUM Main Library (1),
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Springer Handbook of Metrology and Testing by Czichos, Horst. Publication: . 1500p. 500 illus. in color. Availability: Copies available: AUM Main Library (1),
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Optical Measurement of Surface Topography by Leach, Richard. Publication: . XIV, 326p. 231 illus., 42 illus. in color. Availability: Copies available: AUM Main Library (1),
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New Horizons of Applied Scanning Electron Microscopy by Shimizu, Kenichi. Publication: . XIV, 182p. 102 illus., 25 illus. in color. Availability: Copies available: AUM Main Library (1),
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Nanotechnology Standards by Murashov, Vladimir. Publication: . XIV, 262 p. Availability: Copies available: AUM Main Library (1),
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Photo-Excited Charge Collection Spectroscopy by Im, Seongil. Publication: . XI, 101 p. 61 illus. Availability: Copies available: AUM Main Library (1),
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Acoustical Imaging by Nowicki, Andrzej. Publication: . VIII, 508p. 251 illus., 45 illus. in color. Availability: No items available:
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Applied Photometry, Radiometry, and Measurements of Optical Losses by Bukshtab, Michael. Publication: . XX, 712 p. Availability: Copies available: AUM Main Library (1),
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Perfect/Complete Scattering Experiments by Kleinpoppen, Hans. Publication: . XIII, 340 p. 177 illus., 6 illus. in color. Availability: Copies available: AUM Main Library (1),
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The Mie Theory by Hergert, Wolfram. Publication: . XIV, 259 p. 78 illus., 56 illus. in color. Availability: Copies available: AUM Main Library (1),
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Semiconductor Research by Patane, Amalia. Publication: . XIX, 372p. 192 illus., 38 illus. in color. Availability: Copies available: AUM Main Library (1),
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Measurement Uncertainties by Gupta, S. V. Publication: . XX, 324 p. Availability: Copies available: AUM Main Library (1),
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Beam-Wave Interaction in Periodic and Quasi-Periodic Structures by Schächter, Levi. Publication: . XVI, 441 p. Availability: Copies available: AUM Main Library (1),
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